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Automatic Testing Equipment (ATE)
Sub Categories
| Name | Description | Category | ||
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Hioki X-Y in-Circuit HiTester 1240-01/-02/-03 | Detection of IC lead pseudo-contact (poor contact) states • High-speed testing at up to 0.025 sec./step (1240-01, 1240-03) • Detection of IC lead float and pseudo-contact states • Support for active testing (optional feature) • High-precision probing • Large testing area of 510 × 460 mm (1240-01, 1240-02) • Standard transport capability • Automatic alignment function and simple visual test function | Populated Board Testing |
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